Device simulator, or virtual device, has been designed to solve this problem by injecting test data into the system. The simulator:
|Provides test data as read-write settings of different types, including complex tabular settings||Generates signals which change in time according to configurable patterns|
|Fires test events with custom parameters||Simulates communication problems and internal device errors|
|Implements "device-side" operations for processing any test data coming from the system||Provides simulated real-time geographical location data|
The simulator can be configured to provide large and extremely large amounts of value updates and events. This is crucial at the system performance testing and optimization stage.
Another feature useful for testing is generation of various time series patterns, such as sine waves or randomly changing values.